JITLine: A Simpler, Better, Faster, Finer-grained Just-In-Time Defect Prediction

引用情報¶

著者: Chanathip Pornprasit, Chakkrit Kla Tantithamthavorn
タイトル: JITLine: A Simpler, Better, Faster, Finer-grained Just-In-Time Defect Prediction
雑誌 / 会議名: IEEE/ACM 18th International Conference on Mining Software Repositories (MSR)
ページ: pp. 369-379
出版日: June 2021
DOI: https://doi.org/10.1109/MSR52588.2021.00049